Use Case: Mura Defect Detection
OLED/LED/LCD display panels present unique challenges for defect inspection. MURA defects, which can be described as extremely low-contrast stains ranging in size from just a few pixels to large subregions of the panel, are particularly difficult to detect and classify because of their back-end manufacturing process-specific nature. Different defect types can have very similar appearances, and can also occur at the same location. Identifying defect types is important in tracing the source of the manufacturing errors.
SaigeVision® has been successfully applied in detecting a wide array of MURA and other defect types in OLED panels.